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--- mywiki:ejtag [2014/09/29 16:31] – created shaoguoh
+++ mywiki:ejtag [2022/04/02 17:28] (current) – external edit 127.0.0.1
@@ Line 1: / Line 1: @@
 Jtag/Ejtag
+| Reference | {{:mywiki:jtag_training.pdf|}} |
 The JTAG interface, collectively known as a **Test Access Port(TAP)**, uses the following signals to support the operation of boundary scan.
-  - TCK (Test Clock) – this signal synchronizes the internal state machine operations.
+| TCK | Test Clock | this signal synchronizes the internal state machine operations. |
-  - TMS (Test Mode Select) – this signal is sampled at the rising edge of TCK to determine the next state.
+| TMS | Test Mode Select | controls the TAP controller state transitions |
-  - TDI (Test Data In) – this signal represents the data shifted into the device's test or programming logic. It is sampled at the rising edge of TCK when the internal state machine is in the correct state.
+| TDI | Test Data In | serial data from debugger to target |
-  - TDO (Test Data Out) – this signal represents the data shifted out of the device's test or programming logic and is valid on the falling edge of TCK when the internal state machine is in the correct state.
+| TDO | Test Data Out | serial data from target to debugger |
-  - TRST (Test Reset) – this is an optional pin which, when available, can reset the TAP controller's state machine.
+| TRST | Test Reset | optional, resets the TAP controller |
-  -
+The functionality usually offered by JTAG is Debug Access and Boundary Scan:
+  - Sebug Access is used by debugger tools to access the internals of a chip making its resources and functionality available and modifiable, e.g. registers, memories and the system state.
+  - Boundary Scan is used by hardware test tools to test the physical connection of a device, e.g. on a PCB. Although this is usually not the task of a debugger tool the TRACE32 debugger offers mechanisms to access the JTAG TAP in a generic way, e.g. to perform boundary scan using a PRACTICE script or a custom application.
+Registers
+| IR | Instruction Register |
+| DR | Data Registers |
+The width of the IR is not specified by the JTAG standard but needs to be the same for all instructions of a
+specific device. Since the DR is selected according to the loaded instruction the DR width is variable.
+{{:mywiki:jtag_signal.png?|}}